A SIMPLE TECHNIQUE FOR MEASURING DOPING EFFECTS ON DISLOCATION MOTION IN SILICON
نویسندگان
چکیده
منابع مشابه
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Characterization of minority-carrier parameters is a primary interest for a range of devices, including solar cells. For “on-line” testing needs, contactless techniques are mandatory, as any diagnostic requiring contact formation is impractical. Here, we will describe the resonancecoupled photoconductive decay (RCPCD) technique that has proven to be a valuable diagnostic for a number of semicon...
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ژورنال
عنوان ژورنال: Le Journal de Physique Colloques
سال: 1983
ISSN: 0449-1947
DOI: 10.1051/jphyscol:1983409